
jsc2025e015690 (3/6/2025) --- An overview of the prototype with the various components as part of the High Performance Radiation Hardened GaN High Electron Mobility Transistors for Space Applications (Radiation Harden GaN) investigation which studies how radiation affects a type of transistor used in the semiconductor industry. Researchers measure the performance of the devices before, during, and after flight to determine whether performance degrades. This could help determine how well the transistors can tolerate radiation in space. Image courtesy of Department of Electrical and Computer Engineering, University of Delaware.
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NASA ID
jsc2025e015690
Date Created
March 6, 2025
Center
JSC
Media Type
image
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