Hicari sample
iss040e054526 (7/10/2014) --- A photo of Hicari sample cartridge 2 from the Gradient Heating Furnace (GHF) removed in preparation for return on SpaceX-4. The materials science investigation Growth of Homogeneous SiGe Crystals in Microgravity by the TLZ Method (Hicari) aims to verify the crystal-growth by Travelling Liquidous Zone method, and to produce high-quality crystals of Silicon-Germanium (SiGe) semiconductor using the Japanese Experiment Module-Gradient Heating Furnace (JEM-GHF).
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Details
NASA ID
iss040e054526
Date Created
July 10, 2014
Center
JSC
Media Type
image
Photographer
Alex Gerst
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