Hicari Sample Cartridge
iss035e006283 (3/18/2013) --- Photo documentation of the Hicari (Growth of Homogeneous Silicon-Germanium [SiGe] Crystals in Microgravity by the Traveling Liquidous Zone [TLZ] Method) Experiment Sample Cartridge (SC) following its removal from the Kobairo Rack during Expedition 35. The materials science investigation Growth of Homogeneous SiGe Crystals in Microgravity by the TLZ Method (Hicari) aims to verify the crystal-growth by Travelling Liquidous Zone method, and to produce high-quality crystals of Silicon-Germanium (SiGe) semiconductor using the Japanese Experiment Module-Gradient Heating Furnace (JEM-GHF).
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Details
NASA ID
iss035e006283
Date Created
March 18, 2013
Center
JSC
Media Type
image
Photographer
Tom Marshburn
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