Sharp Tips on the Atomic Force Microscope
This image shows the eight sharp tips of the NASA Phoenix Mars Lander Atomic Force Microscope, or AFM. The AFM is part of Phoenix Microscopy, Electrochemistry, and Conductivity Analyzer, or MECA.
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Details
NASA ID
PIA11041
Date Created
August 14, 2008
Center
JPL
Media Type
image
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